Last year we announced the KRAKEN Turnkey Ultrafast Microscope. The KRAKEN is a complete system for ultrafast imaging that integrates an ultrafast laser with the ultrafast microscopy components in a tool with the footprint of a desk!
KRAKEN's ultrafast capabilities are not limited to single images - explore all facets of your sample with hypertemporal, hyperspectral, and volumetric scans. You can find a sneak peek of the hypercube scans with KRAKEN here.
Learn more about the KRAKEN microscope on our website or convince yourself of the power of KRAKEN by contacting us to schedule your KRAKEN demo.
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You know the feeling: You have taken datasets at different times, maybe even with different tools. Now you are trying to look at them at the same time - an absolute nightmare! Our Periscope Software makes data co-localization and parallel visualization easy. Intuitively navigate the datasets, mark fiducial points to co-localize, and mark points of interest to export. Even for large image sizes up to a few gigapixels, you can run this software on your average personal laptop.
Periscope is an internal software that we are transitioning into a product. Contact us for more information.
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MONSTR Sense Technologies Continues to Grow
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We are excited for Anton Vakulenko, Ph.D., to join our growing R&D Team. Anton completed his Ph.D. in Electrical Engineering at the City College of New York (CUNY), where he worked on the design and experimental observation of topological states in photonic metasurfaces with Alexander B. Khanikaev. Anton is bringing his deep expertise in the design and automation of imaging & spectroscopy technology to further MONSTR Sense's SiC defect detection efforts.
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We are thrilled to work with Jie Pan, Ph.D., as an application consultant to further the reach of our KRAKEN Turnkey Ultrafast Microscope. Jie brings broad experience in ultrafast spectroscopy of biological and solid-state materials to MONSTR Sense and will focus on applications of the KRAKEN Microscope.
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MONSTR Sense Technologies awarded patent for box lock-in detector that enables rapid imaging
MONSTR Sense has been awarded a U.S. patent for its invention of Ultrafast Laser Imaging with a Box Lock-in (Patent No. US20240210314A1). The proprietary box lock-in is already powering our NESSIE® laser-scanning microscope, KRAKEN Microscope, and SiC defect detection efforts. This patent protects our unique approach to rapid, nonlinear imaging and significantly enhances the scanning speeds that we can achieve while maintaining performance-leading signal-to-noise ratios.
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Celebrating our dedicated install teams - Installing a BIGFOOT in Prof. Carlos Silva Acuña's Lab
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The ability to interact with our customers and quickly enable sophisticated spectroscopy or microscopy measurements is always a highlight. Last month, our install team went above and beyond to install a BIGFOOT in Prof. Carlos Silva Acuña's lab at the Universite de Montreal. After being turned around mid-air due to Canadian Airport Chaos, more than 24 hours of flight delays, and a last-minute stay at an airport hotel, the team quickly got BIGFOOT up and running, exciting our customers about the ease of use of the ultrafast spectrometer.
A pioneer in ultrafast and nonlinear spectroscopy, we look forward to the results of the BIGFOOT in Carlos' incredible lab!
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Startup Career Fair - March 21 (Ann Arbor, MI, USA)
MONSTR Sense is attending the University of Michigan Startup Career Fair hosted by MPowered. Swing by our table to learn more about the exciting opportunities working for MONSTR Sense.
UIUC-MRL Advanced Material Characterization Workshop 2025 - June 3-4 (Urbana, IL, USA)
MONSTR Sense is a proud Platinum Sponsor of the 2025 Advanced Material Characterization Workshop at the Materials Research Lab at the University of Illinois, Urbana-Champaign. Attend our talk and visit us at our booth to learn about the KRAKEN Turnkey Ultrafast Microscope.
ICSRM 2025 - September 14-19 (Busan, Korea)
MONSTR Sense will be an exhibitor at this year's International Conference on Silicon Carbide and Related Materials in Busan, Korea. Come by Booth 074 to learn more about our silicon carbide defect detection capabilities in substrates and epilayers.
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