MONSTR Sense is excited to announce the launch of the KRAKEN Turnkey Ultrafast Microscope. The KRAKEN is a first-of-its-kind Ultrafast Imaging Microscope System designed for rapid and automated acquisition of hyperspectral, hypertemporal, and volumetric images. The KRAKEN is turnkey– designed to automatically tune the wavelength of ultrafast pulses without any setup realignment – a few keystrokes and everything is operational. The KRAKEN features a high degree of automation of measurements, including wavelength tuning, decay time delays, and focus depth.
“As our business continues to grow and our focus turns more to solving complex semiconductor and materials analysis challenges, we recognized the importance of focusing our companies products on Ultrafast for Imaging, with an emphasis on end-to-end systems, such as the KRAKEN,” Eric Martin, President and Co-founder, stated.
Contact us to schedule demonstrations of KRAKEN and see how it can be applied to your materials analysis problems.
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High-throughput Nonlinear Imaging for Defect Inspection in SiC
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MONSTR Sense Technologies improves and expands access to groundbreaking defect inspection technology
MONSTR Sense's Ultrafast Nonlinear Imaging Technique is providing unprecedented contrast in SiC epilayer and substrates at throughputs comparable to standard in-line methods. Our Ultrafast for Imaging technique has some key advantages:
- High sensitivity to and distinguishability of killer defects by nonlinear signal strength
- High penetration depth allows us to measure through the entire wafer, detecting surface, sub-surface, and substrate defects
- As a coherent technique, it has near-perfect signal collection efficiency, enabling high-throughput without loss of signal
These key advantages enable us to measure all common defects in epilayers, including stacking faults, partial dislocations, carrot defects, and triangles, as well as dislocations in substrates.
Schedule the inspection of your wafer today with our Compound Semiconductor Inspection Service (CSIS).
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A busy summer highlighting MONSTR Sense
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Conference season, Poster awards, and a patent office visit
This summer, we had the opportunity to highlight MONSTR Sense on many occasions: In July, our Lead Research Scientist, Torben Purz, received the best poster award at the 2024 Artificial Intelligence for Materials Science (AIMS) workshop at NIST for his work on automated defect inspection in SiC. Our president, Eric Martin, gave a presentation on our Ultrafast Imaging capabilities at the Fundamental Optical Processes in Semiconductors (FOPS) 2024 Conference. In August, the US Patent Office group on Measuring and Testing visited MONSTR Sense's Ann Arbor headquarters, allowing us to illustrate how MONSTR Sense's work in the semiconductor and optics space fosters innovation and provide insight into the behind-the-scenes work that culminates in patents. In October, the MONSTR Sense Team attended the ICSCRM 2024 Conference in Raleigh, NC, and presented on All-Optical Volumetric Imaging of Killer Defects in a SiC Epilayer.
If you didn't have the chance to catch us at one of these events, check out our products and resources page to learn more about what MONSTR Sense has to offer.
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Imaging exciton interactions in two-dimensional materials and heterostructures with spectroscopic microscopy
This review paper, written in collaboration with the Cundiff Lab at the University of Michigan, emphasizes the wide range of optical techniques that can be used to study exciton interactions in 2D materials across different spatial scales with an emphasis on nonlinear, ultrafast spectroscopic techniques, such as multi-dimensional coherent spectroscopy and transient absorption spectroscopy coupled with imaging. This paper was published in J. Phys. D.
Optical Multidimensional Coherent Spectroscopy Book
This book, co-authored by our co-founder Steven Cundiff, is a must-read for everyone new (or not so new) to multidimensional coherent spectroscopy. It covers the physics behind this sophisticated spectroscopic technique, how to interpret multidimensional coherent spectra, and contains detailed discussions on the insights MDCS can provide in different material systems. This book has been published by Oxford University Press.
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