MONSTR Sense Technologies demonstrates Wafer-Scale Imaging of III-V Semiconductors
MONSTR Sense Technologies® has recently demonstrated wafer-scale imaging for the inspection of GaAs Quantum Well wafers, which are used for manufacturing laser diodes.
MONSTR Sense's nonlinear imaging approach uniquely identifies defects that are not accessible with conventional white light inspection, detecting sub-10-micron defects across the wafer.
Find a full image of a GaAs quantum well wafer below.
Company Update
MONSTR Sense at CLEO 2023
Last week, the MONSTR Sense team visited the Conference on Laser and Electro-Optics (CLEO), and our Optical Research Scientist, Torben, gave a talk about how MONSTR Sense is changing the future of advanced material characterization and inspection. We enjoyed meeting with past and future customers and getting inspiration from fellow scientists.
Go Blue!
MONSTR Sense is building up its capabilities, and we have started acquiring wafer images in the UV-A regime. If you have large area scientific or industrial samples that you would like to have characterized, feel free to reach out to us for in-house inspection. 

The MONSTR Sense Tech Tip
MONSTR Sense's collinear single-beam approach, compared to the conventional wave-vector selection in ultrafast spectroscopy, is not only great for microscopy - it also comes with its own "collinear advantage". The tight, sub-micron focus yields peak intensities 1000 times higher than for conventional ultrafast spectrometer, enabling nonlinear measurements with a MHz oscillator instead of kHz amplifiers. This has tremendous implications for both signal-to-noise ratio by reaching the shot noise limit and for data acquisition speed.

If you want to know more about how MONSTR Sense's products can help your research, contact us.

MONSTR Sense Products
Featured Research

Quantum Dynamics of Attractive and Repulsive Polarons in a Doped MoSe2 Monolayer
Researchers at the University of Texas at Austin performed multidimensional coherent spectroscopy to study the dynamics of Fermi polarons in a doped MoSe2 monolayer model system. This work was accomplished with the MONSTR Sense BIGFOOT® electronics.
This work is published in Physical Review X and can be found here.

Coherent imaging and dynamics of excitons in MoSe2 monolayers epitaxially grown on hexagonal boron nitride
Researchers at the University of Warsaw and University Grenoble Alpes CNRS have performed four-wave mixing microscopy on an MBE-grown MoSe2 monolayer to study the quality of epitaxially grown transition metal dichalcogenides through lineshape studies.
This work is published in Nanoscale and can be found here.

MONSTR Sense Resources
Upcoming Events

International Symposium on Molecular Spectroscopy, June 19-23, 2023
MONSTR Sense is a proud sponsor and exhibitor for the International Symposium on Molecular Spectroscopy at the University of Illinois, Urbana-Champaign. Visit us at our booth to learn more about our product capabilities and see a live demo of BIGFOOT.

International Conference on Silicon Carbide and Related Materials, September 17-22, 2023
MONSTR Sense's president Eric Martin will be vising the International Conference on Silicon Carbide and Related Materials (ICSCRM). Please reach out if you want to discuss how MONSTR Sense can help your Silicon Carbide or Gallium Nitride wafer inspection.
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